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The state-of-the-art determines the remaining useful lifetime (RUL) through a steady-state, fixed power cycling tests (PCT) without considering the impact of dynamically changing environmental conditions. It has resulted in considerable RUL prediction errors in the real world. However, the dynamic changing conditions (e.g., large temperature swings) may affect the degradation evolution of SiC MOSFET, which could eventually result in RUL changes. Thus, it must be integrated to make accurate predictions. To precisely understand the RUL variation complexity, the junction temperature (Tj) has been measured with a Negative Thermal Coefficient (NTC) thermistor, Temperature Sensitive Electrical Parameter (TSEP), and these profiles have been modeled through the thermal model RC foster network using Extended Kalman Filter (EKF). Then, the on-state resistance (Rds,on) variations and Degradation Acceleration Factor (DAF) under the dynamic environment conditions are integrated into a lifetime prediction model to accurately predict the RUL through the Long Short-Term Memory (LSTM) machine learning algorithm.